Milton C Jaehnig

Title: Milton C. Jaehnig: Innovator in Secondary Ion Mass Spectrometry

Introduction

Milton C. Jaehnig is a notable inventor based in Beaverton, Oregon. He has made significant contributions to the field of mass spectrometry, particularly through his innovative patent in secondary ion mass spectrometry systems. His work has implications for chemical analysis and material science.

Latest Patents

Jaehnig holds a patent for a secondary ion mass spectrometry system. This system utilizes a focused ion beam directed toward a sample while iodine vapor is introduced to enhance the sputtering of material. The iodine vapor, generated by heating solid iodine to temperatures between 30°C and 50°C, aids in converting neutral sputtered species into ionic forms. A quadrupole mass analyzer is employed to receive the secondary ions sputtered from the sample, facilitating chemical analysis. This method allows for the handling of iodine in a solid state, minimizing toxic hazards and eliminating the need for external plumbing.

Career Highlights

Milton C. Jaehnig has worked at FEI Company, where he has applied his expertise in mass spectrometry. His innovative approaches have contributed to advancements in analytical techniques and instrumentation.

Collaborations

Throughout his career, Jaehnig has collaborated with notable colleagues, including Lynwood W. Swanson and John M. Lindquist. These collaborations have fostered a productive environment for innovation and research.

Conclusion

Milton C. Jaehnig's contributions to secondary ion mass spectrometry exemplify the impact of innovative thinking in scientific research. His work continues to influence the field and enhance analytical capabilities.