Company Filing History:
Years Active: 2022
Title: Milos Hovorka: Innovator in 3D Imaging Technologies
Introduction
Milos Hovorka is a prominent inventor based in Brno, Czech Republic. He has made significant contributions to the field of 3D imaging technologies, particularly in the context of charged particle systems. With a total of 2 patents, Hovorka's work focuses on enhancing the quality and resolution of 3D reconstructions of samples.
Latest Patents
Hovorka's latest patents include innovative methods and systems for depth reconstruction of 3D images. One of his patents, titled "Depth reconstruction for 3D images of samples in a charged particle system," outlines techniques for generating high-resolution reconstructions of 3D samples. This involves using a depth blur reducing algorithm to enhance data obtained from slice and view processes. The algorithm is designed to minimize depth blur caused by electron interactions outside the first and second layers of the sample.
Another notable patent is "Slice depth reconstruction of charged particle images using model simulation for improved generation of 3D sample images." This patent describes methods for acquiring data from multiple layers of a sample and utilizing simulated models to segregate data into component portions. The goal is to create reconstructions of individual layers and 3D reconstructions of the sample with reduced depth blur.
Career Highlights
Milos Hovorka is currently employed at FEI Company, where he continues to develop and refine his innovative imaging technologies. His work has positioned him as a key figure in advancing the capabilities of 3D imaging in scientific research and industrial applications.
Collaborations
Hovorka collaborates with talented individuals in his field, including Pavel Potocek and Lukás Hübner. These collaborations enhance the research and development efforts at FEI Company, fostering an environment of innovation and creativity.
Conclusion
Milos Hovorka's contributions to 3D imaging technologies are noteworthy and impactful. His patents reflect a commitment to improving the accuracy and quality of imaging processes, which are essential in various scientific and industrial applications. Hovorka's work continues to inspire advancements in the field of charged particle imaging.