This inventor holds 1 USPTO granted patent. Top assignee: Systems Research Laboratories. Active years: 1978.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1978
Title: The Innovations of Milo S Snyder
Introduction
Milo S Snyder is an accomplished inventor based in Xenia, OH (US). He is known for his significant contributions to the field of optical measurement technology. With a focus on precision and accuracy, Snyder has developed innovative solutions that enhance measurement capabilities.
Latest Patents
Snyder holds a patent for a "Calibrated Optical Micrometer." This invention presents a method and apparatus for calibrating an optical micrometer by utilizing a precisely dimensioned grate. The grate is temporarily introduced into the optical path of the instrument within its zone of measurement. A beam of light is scanned through this zone and across the grate, with the information recorded in an electronic memory. Subsequently, articles placed within the zone of measurement are scanned by the beam, and the information obtained is compared against the calibration data to provide accurate measurements of the articles. This patent showcases Snyder's innovative approach to improving measurement accuracy.
Career Highlights
Milo S Snyder is associated with Systems Research Laboratories, where he has made significant contributions to the development of optical measurement technologies. His work has been instrumental in advancing the capabilities of optical instruments.
Collaborations
Snyder has collaborated with notable colleagues, including Jack T Dehait and David C Dietz. These partnerships have fostered a collaborative environment that encourages innovation and the sharing of ideas.
Conclusion
Milo S Snyder's contributions to the field of optical measurement through his patented inventions highlight his expertise and dedication to innovation. His work continues to influence the industry and improve measurement technologies.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile