The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 04, 1978
Filed:
Jan. 06, 1977
Jack T Dehait, Dayton, OH (US);
David C Dietz, Xenia, OH (US);
Milo S Snyder, Xenia, OH (US);
Francis M Talor, Xenia, OH (US);
Systems Research Laboratories, Inc., Dayton, OH (US);
Abstract
A method and apparatus for calibrating an optical micrometer utilizes a precisely dimensioned grate which is temporarily introduced into the optical path of the instrument within its zone of measurement. A beam of light is scanned through the zone of measurement and across the grate, and the information obtained therefrom is recorded in an electronic memory. Thereafter, articles subsequently placed within the zone of measurement are scanned by the beam, and the information obtained therefrom is compared against the calibration data to provide an accurate measurement of the article.