Company Filing History:
Years Active: 1978
Title: Jack T Dehait: Innovator in Optical Measurement Technology
Introduction
Jack T Dehait is a notable inventor based in Dayton, OH (US), recognized for his contributions to optical measurement technology. With a total of 2 patents, he has made significant advancements in the field, particularly in the design and calibration of optical micrometers.
Latest Patents
One of his latest patents is the "Half-maximum threshold circuit for optical micrometer." This invention includes circuit means for accurately determining the passage of a scanning beam of light across the edges of an article placed within the measurement zone. By sensing the half power point of the beam as received by a photodetector, the accuracy of the measurement becomes independent of the intensity of the scanning beam. The half power point is determined by comparing the amplitude of the photodetector output signal with its responsive half amplitude value. Delay means are provided to account for the time it takes to reach full amplitude, which is determined by the dimensions of the beam and the scanning rate.
Another significant patent is the "Calibrated optical micrometer." This method and apparatus utilize a precisely dimensioned grate temporarily introduced into the optical path of the instrument within its measurement zone. A beam of light is scanned through the zone of measurement and across the grate, with the information recorded in an electronic memory. Articles placed within the measurement zone are subsequently scanned, and the obtained information is compared against the calibration data to ensure accurate measurements.
Career Highlights
Jack T Dehait has been associated with Systems Research Laboratories, where he has applied his expertise in optical technologies. His work has contributed to the advancement of measurement techniques that are crucial in various applications.
Collaborations
Throughout his career, Jack has collaborated with notable colleagues, including David C Dietz and Milo S Snyder. These collaborations have fostered innovation and development in their respective fields.
Conclusion
Jack T Dehait's contributions to optical measurement technology through his patents and work at Systems Research Laboratories highlight his role as an influential inventor. His innovations continue to impact the accuracy and efficiency of optical micrometers in various applications.