The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 27, 1978
Filed:
Jan. 06, 1977
Jack T Dehait, Dayton, OH (US);
Systems Research Laboratories, Inc., Dayton, OH (US);
Abstract
An optical micrometer includes circuit means for determining accurately the passage of a scanning beam of light across the edges of an article placed within the zone of measurement. By sensing the half power point of the beam as received by a photodetector, the accuracy of the measurement is made independent of the intensity of the scanning beam. The half power point is determined by comparing the amplitude of the photodetector output signal with its responsive half amplitude value. Since it is not possible to determine half-amplitude value until after full amplitude has been reached, delay means are provided, the amount of delay being determined by the dimensions of the beam and the scanning rate.