Minamitsuru, Japan

Miki Yuyama

This inventor holds 1 USPTO granted patent. Top assignee: Renesas Technology Corp.. Active years: 2005.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Miki Yuyama. Retrieved from https://idiyas.com/inventor/miki-yuyama

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 104(Granted Patents)


Company Filing History:


Years Active: 2005

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1 patent (USPTO):Explore Patents

Title: Miki Yuyama: Innovator in RFID Technology

Introduction

Miki Yuyama is a prominent inventor based in Minamitsuru-gun, Japan. She has made significant contributions to the field of radio frequency identification (RFID) technology. Her innovative work has led to the development of a patent that enhances the versatility and cost-effectiveness of RFID systems.

Latest Patents

Miki Yuyama holds a patent for an RFID and IC card technology. This invention provides a wide working voltage range and general versatility at a low cost. It eliminates the need for changing the internal circuit design due to external factors. Additionally, the RFID features an arrangement that allows for a low impedance state when its internal data communication circuit is in a reset state.

Career Highlights

Yuyama is currently employed at Renesas Technology Corporation, where she continues to advance her research and development efforts in RFID technology. Her work has been instrumental in pushing the boundaries of what is possible in this field.

Collaborations

Miki Yuyama collaborates with notable colleagues, including Takehiro Ohkawa and Hiroshi Yoshigi. Their combined expertise contributes to the innovative projects at Renesas Technology Corporation.

Conclusion

Miki Yuyama is a trailblazer in RFID technology, with her patent showcasing her ability to innovate in a rapidly evolving field. Her contributions are paving the way for future advancements in identification systems.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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