Location History:
- Albnay, NY (US) (2000)
- Albany, NY (US) (2001 - 2014)
Company Filing History:
8 out of 32 
5 out of 5 
1 out of 1 Years Active: 2000-2014
Title: Innovations and Contributions of Mikhail A. Gutin
Introduction
Mikhail A. Gutin is a prominent inventor based in Albany, NY, known for his significant contributions to the field of optics and imaging. With a total of 13 patents to his name, Gutin has developed innovative methods and systems that enhance the accuracy and efficiency of optical measurements.
Latest Patents
Among his latest patents is a groundbreaking method for the metrology of optics with high aberrations. This interferometry method involves a sophisticated system for testing samples that includes a tilt mirror and a reference mirror. The method allows for precise measurements by situating a sample under test between these mirrors and deriving a complete first-tilt-alignment wavefront metrology from various interferograms.
Another notable patent is his holography-based device, system, and method for coded aperture imaging. This system utilizes a coded aperture mask to produce a diffracted projection of a target scene, which is then processed to create a representation of that scene. The innovative approach involves correlating the diffracted projection with a known array pattern, showcasing Gutin's expertise in advanced imaging techniques.
Career Highlights
Throughout his career, Mikhail A. Gutin has worked with several esteemed companies, including Inter Science GmbH and Applied Science Innovations, Inc. His work in these organizations has allowed him to apply his inventive skills to real-world applications, furthering advancements in