The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 30, 2000

Filed:

Sep. 08, 1998
Applicant:
Inventors:

James Castracane, Albnay, NY (US);

Mikhail A Gutin, Albnay, NY (US);

Lawrence P Clow, Jr, Waterford, NY (US);

Assignee:

InterScience, Inc., Troy, NY (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J / ;
U.S. Cl.
CPC ...
2502 / ; 313524 ;
Abstract

An improved intensity control system for an intensified imaging system allows continuous viewing through an intensified imaging system while protecting saturated areas from the negative effects of overexposure. A micromirror array (MMA) is used in conjunction with associated optics to control the intensity incident on the image intensifier. Control circuitry determines if pixel intensity is above or below the preset threshold level. If above, the corresponding elements of the MMA array will deflect the incident light in that specific area thereby eliminating saturation of the pixels. The rest of the image is maintained for continuous viewing. A continuous feedback loop monitors the intensity levels of pixels and actively controls the incident light using the MMA.


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