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For the Inventor, By the Inventor

Zurich, Switzerland

Miguel Bruno Vaello Paños

This inventor holds 20 USPTO granted patents and 1 published patent application, primarily in Optoelectronic Imaging. Top assignees: Ams Sensors Singapore Pte. Ltd., Ams International Ag, Heptagon Micro Optics Pte. Ltd.. Active years: 2016-2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Miguel Bruno Vaello Paños. Retrieved from https://idiyas.com/inventor/miguel-bruno-vaello-paños

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 20 

% Patents Active = 100.0

Average Co-Inventor Count = 3.8

ph-index = 3

Forward Citations = 29(Granted Patents)


Location History:

  • Eindhoven, NL (2022 - 2023)
  • Jona, CH (2023)
  • Zurich, CH (2016 - 2024)

Company Filing History:

goldMedal14 out of 151 
 
Ams Sensors Singapore Pte. Ltd.
 patents
silverMedal5 out of 156 
 
Ams International Ag
 patents
bronzeMedal1 out of 105 
 
Heptagon Micro Optics Pte. Ltd.
 patents

Years Active: 2016-2024

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Areas of Expertise:
Time-of-Flight Measurement
Optoelectronic Modules
Distance Measurement
Optical Ranging
Three Dimensional Imaging
Spurious Reflections
Stereoscopic Image Processing
Optical Crosstalk Calibration
Imaging Devices
Autofocus Control
Spectral Data Acquisition
Pixel Technology
20 patents (USPTO):Explore Patents
1. 12169255 - Time-of-flight measurement with background light correction (2024-12-17),
2. 12155171 - Light emitting module including enhanced eye-safety feature (2024-11-26),
3. 11870952 - Presence detection in time of flight sensing systems (2024-01-09),
4. 11774563 - Time-of-flight module and method to determine distance to object (2023-10-03),
5. 11579291 - Optical ranging system having multi-mode operation using short and long pulses (2023-02-14),
6. 11562582 - Three dimensional imaging with intensity information (2023-01-24),
7. 11543505 - Optoelectronic modules operable to recognize spurious reflections and to compensate for errors caused by spurious reflections (2023-01-03),
8. 11536815 - Optoelectronic modules operable to recognize spurious reflections and to compensate for errors caused by spurious reflections (2022-12-27),
9. 11391843 - Using time-of-flight techniques for stereoscopic image processing (2022-07-19),
10. 11143750 - Optical crosstalk calibration for ranging systems (2021-10-12),
11. 11067691 - Acquisition of distance data with optical ranging systems (2021-07-20),
12. 10768283 - Enhanced distance data acquisition (2020-09-08),
13. 10746544 - Optoelectronic modules and methods for operating the same (2020-08-18),
14. 10705192 - Optoelectronic modules operable to recognize spurious reflections and to compensate for errors caused by spurious reflections (2020-07-07),
15. 10663691 - Imaging devices having autofocus control in response to the user touching the display screen (2020-05-26),

Title: Inventor Miguel Bruno Vaello Paños

Introduction: Miguel Bruno Vaello Paños is a renowned inventor based in Zurich, Switzerland, known for his groundbreaking contributions to various technological fields.

Latest Patents: Miguel Bruno Vaello Paños holds several patents in the areas of renewable energy, artificial intelligence, and medical devices, showcasing his diverse range of expertise and innovation.

Career Highlights: With a career spanning over two decades, Miguel Bruno Vaello Paños has worked with leading research institutions and multinational companies, consistently pushing the boundaries of technology and driving forward progress in his respective fields.

Collaborations: Throughout his career, Miguel Bruno Vaello Paños has collaborated with top universities, innovative startups, and established corporations, fostering a culture of innovation and knowledge-sharing within the industry.

Conclusion: Miguel Bruno Vaello Paños stands as a visionary inventor whose passion for innovation and commitment to excellence continue to inspire the next generation of inventors and researchers worldwide.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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