The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 08, 2020

Filed:

Nov. 10, 2016
Applicant:

Ams Sensors Singapore Pte. Ltd., Singapore, SG;

Inventors:

Bryant Hansen, Zurich, CH;

Cassian Strässle, Wädenswil, CH;

Miguel Bruno Vaello Paños, Zurich, CH;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 7/4912 (2020.01); G01S 17/89 (2020.01); G01S 7/497 (2006.01); G01S 7/48 (2006.01); G01B 21/04 (2006.01); G01B 11/24 (2006.01); G01S 17/36 (2006.01);
U.S. Cl.
CPC ...
G01S 7/4918 (2013.01); G01B 11/24 (2013.01); G01B 21/045 (2013.01); G01S 7/4808 (2013.01); G01S 7/497 (2013.01); G01S 17/36 (2013.01); G01S 17/89 (2013.01);
Abstract

A distance acquisition method comprising: initializing an optical ranging system, the optical ranging system including a plurality of pixels operable to covert incident light to electrical charges; collecting electrical charges with the plurality of exposed pixels over an integration time, each pixel collecting electrical charges with an amplification and a sensitivity; correlating the electrical charges collected in each pixel to an exposure value for each pixel, the exposure value corresponding to being adequately exposed, over-exposed, or under-exposed; identifying each exposure value for each pixel as being either valid or invalid, wherein a valid exposure value corresponds to an adequately exposed pixel and an invalid exposure value corresponds to an over-exposed or under-exposed pixel; totalling the number of valid exposure value pixels; totalling the number invalid exposure value pixels; determining an exposure ratio, the ratio being the number of pixels with valid exposure values divided by the number of pixels with invalid exposure values; totalling the number of over-exposed pixels; totalling the number of under-exposed pixels; determining an invalid exposure ratio, the invalid exposure ratio being the number of over-exposed pixels divided by the number of under-exposed pixels; and determining an average valid exposure value, the average valid exposure value being the average of the valid exposure values. The method additionally comprises: using the exposure ratio, the invalid exposure ratio and the average valid exposure to optimise the integration time; using the exposure value for each pixel to optimise the amplification and sensitivity for each pixel; and determining distance data from electrical charges collected from at least one of the plurality of pixels.


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