This inventor holds 1 USPTO granted patent. Top assignee: Faro Technologies, Inc.. Active years: 2025.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2025
Title: Michelle Edwards: Innovator in Measurement Technology
Introduction
Michelle Edwards is a notable inventor based in Ormond Beach, Florida. She has made significant contributions to the field of measurement technology, particularly with her innovative methods for measuring gaps between material layers. Her work is essential for various applications in engineering and manufacturing.
Latest Patents
Michelle holds a patent for a "System and method of measuring gaps." This invention involves a method for measuring gaps between material layers by inserting a probe tip within a through-hole defined in a structural component. The probe tip is attached to an articulated arm coordinate measuring machine (AACMM) and is designed to contact the hole surface of the through-hole. The method includes translating the probe tip along the hole surface in a direction parallel to an axis through the through-hole. As the probe tip passes over a gap, it measures the radial position during translation, including any deflection as it crosses the gap. The gap size is then calculated based on this deflection and the size of the probe tip. This innovative approach enhances precision in measurements, which is crucial for quality control in manufacturing processes.
Career Highlights
Michelle Edwards is currently employed at Faro Technologies, Inc., a company known for its advanced measurement and imaging solutions. Her role at Faro Technologies allows her to apply her expertise in measurement technology and contribute to the development of cutting-edge solutions in the industry.
Collaborations
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Conclusion
Michelle Edwards is a pioneering inventor whose work in measurement technology has the potential to impact various industries significantly. Her innovative patent demonstrates her commitment to advancing precision measurement techniques.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
