The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 23, 2025
Filed:
Jun. 05, 2023
Faro Technologies, Inc., Lake Mary, FL (US);
Michelle Edwards, Ormond, FL (US);
FARO Technologies, Inc., Lake Mary, FL (US);
Abstract
A method for measuring gaps between material layers include inserting a probe tip within a through-hole defined in a structural component. The probe tip is arranged at the end of a probe assembly attached to articulated arm coordinate measuring machine (AACMM). The method further includes contacting the probe tip with a hole surface of the through-hole. The method further includes translating the probe tip along the hole surface in a direction parallel to an axis through the through-hole. The probe tip passes over a gap along the through-hole. The method further includes measuring a radial position of the probe tip during the translation along the hole surface and across the gap including a deflection of radial position of the probe tip as the probe tip crosses the gap. The method further includes calculating a gap size of the gap based on the deflection and a size of the probe tip.