Michel Tauvy

Title: Michel Tauvy: Innovator in Wavefront Analysis

Introduction

Michel Tauvy is a notable inventor based in Montigny le Bretonneux, France. He has made significant contributions to the field of wavefront analysis, particularly through his innovative methods involving multilateral interferometry. His work has implications for various applications in optics and engineering.

Latest Patents

Michel Tauvy holds a patent for a wavefront analysis method that utilizes multilateral interferometry with frequency difference. The method involves positioning a diffraction grating with a two-dimensional meshing on the path of the beam to be analyzed. It processes at least two interferograms of different colors, each obtained from two sub-beams with varying diffraction orders. This invention is designed to analyze and correct divided wavefronts, showcasing his expertise in optical technologies.

Career Highlights

Throughout his career, Michel has worked with prominent organizations, including Onera, which is the National Office for Studies and Aerospace Research in France. His experience in such a prestigious institution highlights his commitment to advancing aerospace technologies and optical research.

Collaborations

Michel has collaborated with talented individuals such as Jerome Primot and Sabrina Velghe. These partnerships have likely contributed to the development and refinement of his innovative methods.

Conclusion

In summary, Michel Tauvy is a distinguished inventor whose work in wavefront analysis has paved the way for advancements in optical technologies. His patent and collaborations reflect his dedication to innovation in the field.