The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 04, 2011
Filed:
Aug. 07, 2008
Jerome Primot, Chatillon, FR;
Sabrina Velghe, Villebon-sur-Yvette, FR;
Nicolas Guerineau, Antony, FR;
Riad Haidar, Paris, FR;
Michel Tauvy, Montigny le Bretonneux, FR;
Jerome Primot, Chatillon, FR;
Sabrina Velghe, Villebon-sur-Yvette, FR;
Nicolas Guerineau, Antony, FR;
Riad Haidar, Paris, FR;
Michel Tauvy, Montigny le Bretonneux, FR;
ONERA (Office National d/Etudes et de Recherches Aerospatiales, Chatillon, FR;
Abstract
The method comprises positioning a diffraction grating with a two-dimensional meshing on the path of the beam to be analyzed and processing at least two interferograms of at least two different colors, each interferogram being obtained in a plane from two sub-beams with different diffraction orders. The invention can be used to analyze and correct divided wavefronts.