This inventor holds 1 USPTO granted patent. Top assignee: Institut National D'optique. Active years: 2015.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2015
Title: Michel Robert: Innovator in Optical Profilometry
Introduction
Michel Robert is a distinguished inventor based in Québec, Canada. He has made significant contributions to the field of optical profilometry, particularly through his innovative methods and apparatuses. His work focuses on enhancing the accuracy and efficiency of 3D optical measurements.
Latest Patents
Michel Robert holds a patent for a "Method and apparatus for triangulation-based 3D optical profilometry." This invention provides a method for determining a centerline for a triangulation-based optical profilometry system. It compensates for the spatial variations of the reflectance of an object's surface. The method involves providing a luminous line on the object, capturing images of the triangulation and compensation lines, and computing a corrected transverse triangulation profile. This innovative approach allows for more precise measurements in optical profiling.
Career Highlights
Michel Robert is associated with the Institut National d'Optique, where he applies his expertise in optical technologies. His work has been instrumental in advancing the capabilities of optical profilometry systems. With a focus on practical applications, he has contributed to the development of systems that integrate his patented methods.
Collaborations
Michel Robert has collaborated with notable colleagues, including Michel Doucet and Daniel Lefebvre. These partnerships have fostered a collaborative environment that enhances innovation and research in optical technologies.
Conclusion
Michel Robert's contributions to optical profilometry exemplify the impact of innovative thinking in technology. His patented methods continue to influence the field, paving the way for advancements in 3D optical measurements.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
