Wedemark, Germany

Michel Bellmann

This inventor holds 1 USPTO granted patent and 2 EPO patents. Top assignee: Netzsch-Gerätebau Gmbh. Active years: 2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Michel Bellmann. Retrieved from https://idiyas.com/inventor/michel-bellmann

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

 

Average Co-Inventor Count = 13.0

ph-index = 1


Company Filing History:


Years Active: 2024

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1 patent (USPTO):Explore Patents

Title: Michel Bellmann - Innovator in Material Analysis Technology

Introduction

Michel Bellmann is a notable inventor based in Wedemark, Germany. He has made significant contributions to the field of material analysis through his innovative designs and patents. His work focuses on developing advanced devices that enhance the efficiency and accuracy of material testing.

Latest Patents

Michel Bellmann holds a patent for a material analysis device with quick attachment. This device is designed for analyzing material samples and features a temperature-controllable sample chamber. It includes a sample holder that protrudes into the chamber, supported by at least one pillar. The device also incorporates a loading shaft, which applies force to the sample in a defined manner, ensuring precise loading and analysis.

Career Highlights

Throughout his career, Michel has been associated with Netzsch-Gerätebau GmbH, a company known for its expertise in thermal analysis and material characterization. His work at the company has allowed him to develop cutting-edge technologies that are widely used in various industries.

Collaborations

Michel collaborates with talented professionals in his field, including Georg Neumann and Marco Zier. These partnerships have fostered innovation and have contributed to the advancement of material analysis technologies.

Conclusion

Michel Bellmann's contributions to material analysis technology exemplify his dedication to innovation and excellence. His patent for a material analysis device showcases his ability to create solutions that meet the needs of modern industries.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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