The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 02, 2024
Filed:
May. 05, 2022
Netzsch-gerätebau Gmbh, Selb, DE;
Georg Neumann, Schönwald, DE;
Marco Zier, Fichtelberg, DE;
Patrick Biermann, Seelze, DE;
Jürgen Tschöpel, Arzberg, DE;
Reinhard Gschwendtner, Marktredwitz, DE;
Wiebold Wurpts, Schwarmstedt, DE;
Markus Hilmer, Lehrte, DE;
Leonhard Faulhammer, Selb, DE;
Stephan Lauer, Wedemark, DE;
Kai Dinges, Grethem, DE;
Claas Luhmann, Isernhager, DE;
Michel Bellmann, Wedemark, DE;
Georg Storch, Selb, DE;
NETZSCH-Gerätebau GmbH, Selb, DE;
Abstract
A material analysis device for analysing a material sample. The material analysis device is equipped with a—generally temperature-controllable—sample chamber and a sample holder, which, supported by at least one pillar, protrudes into the sample chamber, and a loading shaft, to one end of which force is applied by an exciter, and the other end of which bears a connecting member, with which it transmits force to the sample in a defined manner and loads same thereby.