Michael Z Felske

Michael Z Felske is a notable inventor based in Milton, VT (US). He has made significant contributions to the field of integrated circuits, holding a total of 3 patents. His work focuses on enhancing the functionality and reliability of integrated circuits through innovative testing and repair methods.

Latest Patents

One of Felske's latest patents is titled "Partial good integrated circuit and method of testing same." This invention involves an integrated circuit that includes a multiplicity of macro-circuits with the same function. It features a fuse bank that stores test data indicating which macro-circuits failed during testing. The invention also includes mechanisms to prevent the utilization of failing macro-circuits during the operation of the integrated circuit. The method generates a partial good integrated circuit by providing an integrated circuit with multiple macro-circuits, testing each macro-circuit, programming the fuses in the fuse bank, and preventing the use of failing macro-circuits based on the stored data.

Career Highlights

Michael Z Felske is currently employed at International Business Machines Corporation (IBM). His role at IBM allows him to work on cutting-edge technologies and contribute to advancements in integrated circuit design and testing.

Collaborations

Felske has collaborated with notable coworkers such as Leonard O Farnsworth, III and Benjamin P Lynch. These collaborations have likely enriched his work and contributed to the development of innovative solutions in the field.

Conclusion

Michael Z Felske is a distinguished inventor whose work in integrated circuit technology has led to significant advancements. His innovative patents and contributions to IBM highlight his commitment to improving the reliability and functionality of electronic devices.