This inventor holds 1 USPTO granted patent. Top assignee: Rockwell International Corporation. Active years: 1984.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1984
Title: Innovations of Michael S. Kim in Ultrasonic Inspection Technology
Introduction
Michael S. Kim is an accomplished inventor based in Canoga Park, California. He has made significant contributions to the field of ultrasonic inspection technology. His innovative approach has led to the development of a unique calibration system that enhances the efficiency and accuracy of ultrasonic inspections.
Latest Patents
One of Michael S. Kim's notable patents is for an "Automatic Calibration System for Ultrasonic Inspection." This invention provides a method and apparatus for calibrating an ultrasonic inspection system that utilizes multiple transducers. The system employs a distance-amplitude correction circuit that utilizes a digital-to-analog converter to ensure consistent amplitude of return signals from flaws, regardless of their depth. This innovation eliminates the need for tedious manual calibration methods, streamlining the inspection process.
Career Highlights
Michael S. Kim has had a distinguished career at Rockwell International Corporation, where he has been instrumental in advancing ultrasonic inspection technologies. His work has not only improved the efficiency of inspection systems but has also contributed to the overall safety and reliability of various applications in industry.
Collaborations
Throughout his career, Michael has collaborated with esteemed colleagues such as Alfred W. Thiele and Robert E. McLain. These partnerships have fostered a collaborative environment that has led to further innovations in the field.
Conclusion
Michael S. Kim's contributions to ultrasonic inspection technology exemplify the impact of innovative thinking in engineering. His automatic calibration system represents a significant advancement that enhances the accuracy and efficiency of inspections. His work continues to influence the industry and inspire future innovations.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
