The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 24, 1984
Filed:
Sep. 17, 1981
Alfred W Thiele, Canoga Park, CA (US);
Robert E McLain, Woodland Hills, CA (US);
Modesto T Martinez, Jr, Duarte, CA (US);
Richard C Lewis, Santa Monica, CA (US);
Michael S Kim, Canoga Park, CA (US);
Rockwell International Corporation, El Segundo, CA (US);
Abstract
A method and apparatus is disclosed for calibrating an ultrasonic inspection system having a plurality of transducers (12a, 12b, 12c) coupled by a common amplifier (16) to a distance-amplitude correction (D-AC) circuit comprised of a multiplying digital-to-analog converter (26') which receives, as a function of the transit time of an ultrasonic signal measured by a clock counter (34), a D-AC correction stored in a look-up table in a random access memory (24'). The D-AC correction function stored in the look-up table for each transducer is the inverse of a return signal response curve determined by measuring the peak amplitude of return signals from calibration holes at known depths in a test block (10) while in a calibrate mode, i.e., with a switch (SW) in a state to bypass the MDAC. An equation of a curve that best fits the peak measurements is then found by a digital computer (20) and used to determine the values of points along a curve superimposed on the response curve, except at near field where the calibration system is provided with truncation for near-field effects. Inverse values of these points are then stored in the look-up table for use as correction factors applied to the amplitudes of return signals during an inspection mode of operation. In that way, all return signals from flaws of the same size are caused to have the same amplitude regardless of depth, without the need for utilizing tedious and time-consuming manual calibration methods.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile