Round Rock, TX, United States of America

Michael P Baker


Average Co-Inventor Count = 2.3

ph-index = 2

Forward Citations = 14(Granted Patents)


Company Filing History:


Years Active: 2007-2011

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3 patents (USPTO):Explore Patents

Title: Michael P Baker: Innovator in Electrical Testing Technologies

Introduction

Michael P Baker is a notable inventor based in Round Rock, TX (US). He has made significant contributions to the field of electrical testing, holding a total of 3 patents. His innovative approaches have enhanced the efficiency and effectiveness of testing devices in various applications.

Latest Patents

One of Baker's latest patents is a "Method for speeding up serial data tolerance testing." This invention involves a receive test accelerator that retrieves an adjusted jitter amount and an adjusted test time for testing a device. The adjusted parameters correspond to a bit error rate extrapolated from a baseline, allowing for more efficient testing. Another significant patent is the "Method and apparatus for electrical testing." This invention features a test apparatus with a probe that can be positioned close to contact pads, requiring minimal solder connections. The probe is configurable to meet various electrical specifications, enabling a single circuit board to be used with multiple probes for diverse testing requirements.

Career Highlights

Throughout his career, Michael P Baker has worked with prominent companies in the semiconductor industry, including Freescale Semiconductor, Inc. and Cypress Semiconductor Corporation. His experience in these organizations has contributed to his expertise in electrical testing technologies.

Collaborations

Baker has collaborated with notable colleagues such as Samuel G Stephens and Steven C Meyers. These partnerships have likely fostered innovation and the development of advanced testing solutions.

Conclusion

Michael P Baker's contributions to electrical testing through his patents and career experiences highlight his role as an innovator in the field. His work continues to influence the efficiency of testing methodologies in the semiconductor industry.

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