The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 17, 2010

Filed:

Apr. 25, 2008
Applicants:

David E. Halter, Austin, TX (US);

Michael P. Baker, Round Rock, TX (US);

Samuel G. Stephens, Austin, TX (US);

Inventors:

David E. Halter, Austin, TX (US);

Michael P. Baker, Round Rock, TX (US);

Samuel G. Stephens, Austin, TX (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/02 (2006.01); G01R 31/26 (2006.01);
U.S. Cl.
CPC ...
Abstract

A test apparatus and device under test has a probe that can be located very close to contact pads and that requires very few solder connections. In addition, the probe can be configured to meet any appropriate and desired electrical specification while still using a same circuit board. There is no need to attach discrete components to a circuit board. Thus, by using a configurable probe, a single circuit board may be used with multiple probes or a reconfigurable probe to test for compliance with a variety of different electrical specifications having different requirements.


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