The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 13, 2007

Filed:

Jun. 25, 2004
Applicants:

Michael P. Baker, Round Rock, TX (US);

Steven C. Meyers, Round Rock, TX (US);

Inventors:

Michael P. Baker, Round Rock, TX (US);

Steven C. Meyers, Round Rock, TX (US);

Assignee:

Cypress Semiconductor Corp., San Jose, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03H 11/26 (2006.01);
U.S. Cl.
CPC ...
Abstract

A differential delay cell is provided herein that not only receives a pair of differential input values, but also receives a pair of differential control values for delaying the differential input values to produce a pair of differential output values. As such, a delay cell is provided, which is truly differential, and therefore, capable of demonstrating a significant improvement in noise performance. The differential delay cell of the present invention also demonstrates high frequency stability around the center frequency, constant gain and increased tuning range capabilities. In this manner, the differential delay cell may be used in PLL or DLL designs as part of a low noise VCO or a low noise delay line, respectively.


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