Gomaringen, Germany

Michael Mueller

This inventor holds 1 USPTO granted patent. Top assignee: Advantest (Singapore) Pte Ltd. Active years: 2014.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Michael Mueller. Retrieved from https://idiyas.com/inventor/michael-mueller-pfdc9jab

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 1.0

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Company Filing History:


Years Active: 2014

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1 patent (USPTO):Explore Patents

Title: Michael Mueller - Innovator in Binary Value Determination

Introduction

Michael Mueller is a notable inventor based in Gomaringen, Germany. He has made significant contributions to the field of technology, particularly in the area of binary value determination. His innovative approach has led to the development of a unique method that enhances the efficiency of processing binary values.

Latest Patents

Michael Mueller holds a patent for a "Method and apparatus for determining a minimum/maximum of a plurality of binary values." This invention focuses on determining a minimum or maximum from a set of binary values by identifying a bit position where all values are the same. The method involves selecting binary values based on predetermined criteria and repeating the process until a single binary value remains, which is then designated as the minimum or maximum.

Career Highlights

Michael Mueller is currently employed at Advantest (Singapore) Pte Ltd, where he applies his expertise in technology and innovation. His work at Advantest has allowed him to further develop his skills and contribute to advancements in the field.

Collaborations

Due to space constraints, the collaborations section will be omitted.

Conclusion

Michael Mueller's contributions to the field of binary value determination exemplify the spirit of innovation. His patent reflects a deep understanding of technology and its applications, making him a valuable asset in the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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