Michael J Wright is a prominent inventor based in San Carlos, CA (US). He has made significant contributions to the field of semiconductor inspection technologies. With a total of 4 patents to his name, Wright has developed innovative methods and systems that enhance the accuracy and efficiency of semiconductor inspections.

Latest Patents

Wright's latest patents include groundbreaking technologies such as the "Auto-focus system and methods for die-to-die inspection." This patent discloses methods and apparatus for detecting defects in semiconductor samples that have multiple identically designed areas. An inspection tool is utilized to construct an initial focus trajectory for a first swath of the sample. The tool scans the first swath while collecting autofocus data, generating a z offset measurement vector for each identically designed area. A corrected z offset vector is then constructed for inspection, ensuring consistent z offsets across the areas.

Another notable patent is the "Auto focus system for reticle inspection." This invention relates to the inspection of photomasks, where an inspection tool can automatically focus on a reticle using various topographic mapping techniques. These advancements represent significant steps forward in the field of semiconductor inspection.

Career Highlights

Michael J Wright is currently employed at Kla Tencor Corporation, a leading company in the semiconductor equipment industry. His work at Kla Tencor has allowed him to apply his innovative ideas and contribute to the development of advanced inspection technologies.

Collaborations

Wright has collaborated with notable colleagues such as David Alles and Daniel L Belin. These partnerships have fostered a creative environment that encourages the development of cutting-edge technologies in semiconductor inspection.

Conclusion

Michael J Wright's contributions to semiconductor inspection technologies through his patents and work at Kla Tencor Corporation highlight his role as an influential inventor in the field. His innovative approaches continue to shape the future of semiconductor inspection.