Schönau, Germany

Michael Hübner


Average Co-Inventor Count = 2.0

ph-index = 3

Forward Citations = 14(Granted Patents)


Company Filing History:


Years Active: 2005

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3 patents (USPTO):Explore Patents

Title: Michael Hübner: Innovator in Semiconductor Testing Technologies

Introduction

Michael Hübner is a notable inventor based in Schönau, Germany. He has made significant contributions to the field of semiconductor testing, holding a total of 3 patents. His work focuses on enhancing the efficiency and accuracy of testing processes in semiconductor devices.

Latest Patents

Hübner's latest patents include an "Apparatus for the automated testing, calibration and characterization of test adapters." This innovative apparatus enables the automated testing and calibration of test adapters for semiconductor devices. It features a holder for the test adapter that can be rotated in a defined manner, along with at least one probe head that can be adjusted radially with respect to the holder. The probe head is equipped with two or more contact pins whose spacing distance is adjustable. Another significant patent is the "Method for rewiring pads in a wafer-level package." This method allows for the rewiring of contact pads in a wafer-level package, ensuring that the terminals of the characterization pads are available for testing without being accessible to the end user.

Career Highlights

Michael Hübner is currently employed at Infineon Technologies AG, a leading company in semiconductor solutions. His work at Infineon has positioned him as a key player in the development of advanced testing technologies.

Collaborations

Hübner collaborates with talented individuals such as Gunnar H. Krause and Justus Kuhn, contributing to innovative projects within the semiconductor industry.

Conclusion

Michael Hübner's contributions to semiconductor testing technologies through his patents and work at Infineon Technologies AG highlight his role as a significant inventor in the field. His innovative approaches continue to shape the future of semiconductor testing.

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