Poughkeepsie, NY, United States of America

Michael G Ryan

This inventor holds 1 USPTO granted patent. Top assignee: International Business Machines Corporation. Active years: 1985.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Michael G Ryan. Retrieved from https://idiyas.com/inventor/michael-g-ryan-ip2zy1f9

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 6(Granted Patents)


Company Filing History:


Years Active: 1985

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1 patent (USPTO):Explore Patents

Title: Michael G Ryan - Innovator in Particle Detection Systems

Introduction

Michael G Ryan is a notable inventor based in Poughkeepsie, NY (US). He has made significant contributions to the field of technology, particularly in the area of particle detection systems. His innovative work has led to the development of a unique inspection system that enhances the quality control processes in manufacturing.

Latest Patents

Michael holds a patent for a particle detection system. This system is designed to detect the presence of debris on ceramic green sheets prior to screening. The sheets are deposited on a planar stage using a pick-up head. The pick-up head is equipped with a sensor that determines whether debris adhering to the head, the sheet, or the stage is causing a non-planar sheet surface. This invention is crucial for ensuring the integrity of the manufacturing process.

Career Highlights

Michael G Ryan is associated with International Business Machines Corporation, commonly known as IBM. His work at IBM has allowed him to be at the forefront of technological advancements in particle detection and quality assurance.

Collaborations

Throughout his career, Michael has collaborated with esteemed colleagues such as Yves Darves-Bornoz and George E Melvin. These collaborations have further enriched his contributions to the field.

Conclusion

Michael G Ryan's innovative work in particle detection systems exemplifies the impact of technology on manufacturing processes. His patent and contributions continue to influence the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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