The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 30, 1985
Filed:
Jun. 07, 1983
Applicant:
Inventors:
Yves Darves-Bornoz, LaGrangeville, NY (US);
George E Melvin, Poughkeepsie, NY (US);
Michael G Ryan, Poughkeepsie, NY (US);
Dennis L Saylor, LaGrangeville, NY (US);
Assignee:
International Business Machines Corporation, Armonk, NY (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
73159 ; 7343 / ;
Abstract
An inspection system for detecting the presence of debris on ceramic green sheets prior to screening. The sheets are deposited on a planar stage using a pick-up head. The pick-up head carries a sensor to determine whether or not debris adhering to the head, the sheet or the stage is presenting a non-planar sheet surface.