Location History:
- Rowlett, TX (US) (1998 - 2000)
- Richardson, TX (US) (2000)
Company Filing History:
Years Active: 1998-2000
Title: Michael C. Zemek: Innovator in Semiconductor Inspection Technologies
Introduction
Michael C. Zemek is a notable inventor based in Rowlett, Texas, with a focus on semiconductor inspection technologies. He holds three patents that showcase his innovative contributions to the field. His work primarily revolves around enhancing the accuracy and efficiency of inspection systems for semiconductor devices.
Latest Patents
One of Zemek's latest patents is the "High Speed Lead Inspection System." This system determines if the leads of a semiconductor device are in proper positions by capturing images from at least two sides of the device, along with calibration marks. The unique aspect of this invention is that all leads and calibration marks are captured in a single video image, with images from one side offset from the other.
Another significant patent is the "Method and Apparatus for Inspecting a Workpiece." This invention involves a computer vision apparatus and methods for automatically inspecting both 2-dimensional (2D) and 3-dimensional (3D) criteria of objects using a single camera and laser sources. The system illuminates the object under inspection with a first light source to highlight the region of interest, providing image data for 2D analysis. Subsequently, multiple laser sources collect images for 3D analysis. This technology is particularly useful for inspecting packaged semiconductor devices, including Ball-Grid Arrays (BGAs) and Quad Flat Packages (QFPs), as well as for various applications in the computer industry.
Career Highlights
Zemek's career is marked by his role at Semiconductor Technologies & Instruments Pte. Ltd., where he has made significant contributions to the development of advanced inspection systems. His expertise in semiconductor technology has positioned him as a key player in the industry.
Collaborations
Throughout his career, Zemek has collaborated with notable colleagues, including Rajiv Roy and Weerakiat Wahawisan. These collaborations have further enhanced the innovative capabilities of the projects he has been involved in.
Conclusion
Michael C. Zemek's contributions to semiconductor inspection technologies through his patents reflect his commitment to innovation in the field. His work continues to influence the industry, ensuring higher standards of quality and efficiency in semiconductor manufacturing.