Inventors with similar research interests:
Location History:
- Fairport, NY (US) (1982 - 1985)
- Honeove Falls, NY (US) (1995)
- Rochester, NY (US) (1981 - 2004)
- Honeoye, NY (US) (2014)
- Honeoye Falls, NY (US) (1987 - 2022)
Company Filing History:
88 out of 21,594 
8 out of 644 
8 out of 14 
Years Active: 1981-2022
Areas of Expertise:
Title: Michael Alan Marcus: Innovator in Multilayer Structure Measurement
Introduction
Michael Alan Marcus, based in Honeoye Falls, NY, is a renowned inventor with an impressive portfolio of 109 patents. His contributions to the field of technology, particularly in the measurement of multilayer structures, have garnered significant attention and respect within the innovation community.
Latest Patents
Among his latest innovations is an apparatus and method for the measurement of multilayer structures. This method identifies the material and determines the physical thickness of each layer within a multilayer structure. By measuring the optical thickness of each layer as a function of the wavelength of a light source, he calculates a normalized group index of refraction dispersion curve for each layer. These curves are then compared to a reference database of known materials to identify the materials of each layer accurately. Eventually, the physical thickness of each layer is determined using the group index of refraction dispersion curve alongside the optical thickness data collected. This innovative approach is a significant contribution to material science and engineering.
Career Highlights
Michael has held key positions at notable companies, including Eastman Kodak Company and Carestream Health, Inc. His career has been marked by a consistent drive for innovation and excellence in his work, establishing him as a vital asset in the realms of research and development.
Collaborations
Throughout his career, Michael has collaborated with talented individuals, including Hrishikesh Vijaykumar Panchawagh and Jiann-Rong Lee. These collaborations have further enriched his work and driven advancements in technology and science.
Conclusion
Michael Alan Marcus stands out as a thought leader in the realm of measurement technologies for multilayer structures. His numerous patents and collaborative efforts highlight his commitment to innovation and excellence in the engineering domain, solidifying his legacy as a significant inventor.
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