Changzhou, China

Miao Xu

This inventor holds 2 USPTO granted patents and 1 EPO patent. Top assignees: Mettler Toledo (Changzhou) Measurement Technology Ltd., Mettler-Toledo (Changzhou) Precision Instruments Ltd., Mettler-Toledo International Trading (Shanghai) Co., Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Miao Xu. Retrieved from https://idiyas.com/inventor/miao-xu-rjfgrwpb

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 50.0


Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2026

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2 patents (USPTO):Explore Patents

Title: Miao Xu - Innovator in Precision Instruments

Introduction

Miao Xu is a notable inventor based in Changzhou, China. He has made significant contributions to the field of precision instruments, particularly through his work with leading companies in the industry. Although he currently holds no patents, his expertise and experience in the field are noteworthy.

Latest Patents

Miao Xu has not registered any patents to date. However, his work in precision instruments reflects a deep understanding of the technology and its applications.

Career Highlights

Miao Xu has worked with Mettler-Toledo (Changzhou) Precision Instruments Co., Ltd. and Mettler-Toledo Measurement Technology Ltd. These companies are recognized for their advancements in measurement technology and precision instruments. His role in these organizations has allowed him to develop valuable skills and knowledge in the industry.

Collaborations

Miao Xu has collaborated with several professionals in his field, including Ying Zhang and Hongzhi Lin. These collaborations have likely contributed to his understanding and expertise in precision instruments.

Conclusion

Miao Xu is an accomplished inventor in the precision instruments sector, with a strong background in reputable companies. His contributions to the field, although not yet reflected in patents, demonstrate his commitment to innovation and excellence.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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