The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 28, 2026
Filed:
Apr. 15, 2022
Mettler-toledo (Changzhou) Precision Instruments Ltd., Changzhou, CN;
Mettler-toledo (Changzhou) Measurement Technology Ltd., Changzhou, CN;
Mettler-toledo International Trading (Shanghai) Co., Ltd., Shanghai, CN;
Ying Zhang, Changzhou, CN;
Hongzhi Lin, Changzhou, CN;
Jianwei Wu, Changzhou, CN;
Miao Xu, Changzhou, CN;
Mettler-Toledo (Changzhou) Precision Instruments Ltd., Changzhou, CN;
Mettler-Toledo (Changzhou) Measurement Technology Ltd., Changzhou, CN;
Mettler-Toledo International Trading (Shanghai) Co., Ltd., Shanghai, CN;
Abstract
The present invention provides a digital load cell with redundancy design, the digital load cell including: at least one force measuring element that measures a load force applied to the digital load cell, where each force measuring element converts the load force into one analog signal; and one or more analog-to-digital conversion modules, where each force measuring element is connected to at least one analog-to-digital conversion module, and the analog-to-digital conversion module converts the analog signal into a digital signal. According to the digital load cell of the present invention, redundancy design is provided at least for both the force measuring element and the analog-to-digital conversion module, which can effectively ensure the proper operation of the digital load cell.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile