Guangdong, China

Mi Zou

This inventor holds 1 USPTO granted patent. Top assignee: Shenzhen University. Active years: 2019.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Mi Zou. Retrieved from https://idiyas.com/inventor/mi-zou-sno4et08

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2019

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1 patent (USPTO):Explore Patents

Title: Mi Zou - Innovator in Infrared Image Processing

Introduction

Mi Zou is a prominent inventor based in Guangdong, China. He has made significant contributions to the field of image processing, particularly in the area of infrared imaging. His innovative approach to eliminating stripe noise in infrared images has garnered attention in the research community.

Latest Patents

Mi Zou holds a patent for a "Method and system for eliminating stripe noise in infrared images." This patent describes a comprehensive method that includes selecting a specific row of data from an image to be filtered, obtaining a stripe width from the frequency spectrum, and intercepting new sequences of varying lengths. The process culminates in the application of a notch-comb filter and brightness adjustments to produce a clearer image.

Career Highlights

Mi Zou is affiliated with Shenzhen University, where he continues to advance his research in image processing technologies. His work has not only contributed to academic knowledge but also has practical applications in various industries that rely on infrared imaging.

Collaborations

Mi Zou collaborates with notable colleagues, including Jihong Pei and Weixin Xie. Their combined expertise enhances the research output and innovation potential within their projects.

Conclusion

Mi Zou's contributions to the field of infrared image processing exemplify the impact of innovative thinking in technology. His patent and ongoing research at Shenzhen University highlight the importance of advancements in this area.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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