The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 07, 2019

Filed:

Dec. 12, 2017
Applicant:

Shenzhen University, Shenzhen, Guangdong, CN;

Inventors:

Jihong Pei, Guangdong, CN;

Mi Zou, Guangdong, CN;

Weixin Xie, Guangdong, CN;

Xuan Yang, Guangdong, CN;

Assignee:

SHENZHEN UNIVERSITY, Shenzhen, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 5/00 (2006.01); H04N 5/33 (2006.01); H04N 5/217 (2011.01); H04N 5/365 (2011.01);
U.S. Cl.
CPC ...
G06T 5/002 (2013.01); H04N 5/217 (2013.01); H04N 5/33 (2013.01); H04N 5/3658 (2013.01); G06T 2207/10048 (2013.01);
Abstract

A method of eliminating stripe noise for infrared images including: selecting a specific row of data from an to-be-filtered image Aim, and obtaining a stripe width N1 from information of a frequency spectrum of the data; intercepting (N1+1) new sequences of different lengths from a specific row sequence of the image according to the stripe width N1, and obtaining an optimal interception length N by analyzing information of amplitude spectrum of each new sequence; splitting the to-be-filtered image Aim with a size of M×Ninto a pair of optimum to-be-filtered sub-images Bim and Cim with a size of M×N according to the length N; obtaining two sub-images Bimf and Cimf after using a notch-comb filter to filter the two optimum to-be-filtered sub-images Bim and Cim; carrying out a brightness adjustment and a combination process to the two sub-image Bimf and Cimf to obtain an image Aimf.


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