Kuopio, Finland

Mertsi Haapalainen

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Icare Finland Oy. Active years: 2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Mertsi Haapalainen. Retrieved from https://idiyas.com/inventor/mertsi-haapalainen

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

 

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2024

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1 patent (USPTO):Explore Patents

Title: Mertsi Haapalainen: Innovator in Measurement Instrument Technology

Introduction

Mertsi Haapalainen is a notable inventor based in Kuopio, Finland. He has made significant contributions to the field of measurement instruments, showcasing his innovative spirit through his patented technology.

Latest Patents

Mertsi Haapalainen holds a patent for an "Alignment means of measurement instrument." This invention includes a housing with an optical component that has a principal axis aligned with a desired direction. The design features two light sources positioned at specific distances and heights from the optical component, along with an angle barrier means that enhances the functionality of the measurement instrument.

Career Highlights

Throughout his career, Mertsi has demonstrated a commitment to advancing measurement technology. His work has led to the development of practical solutions that improve the accuracy and efficiency of measurement instruments.

Collaborations

Mertsi collaborates with talented individuals such as Mika Salkola and Antti Jaatinen, contributing to a dynamic work environment at Icare Finland Oy. Their combined expertise fosters innovation and drives the development of cutting-edge technologies.

Conclusion

Mertsi Haapalainen's contributions to measurement instrument technology exemplify his dedication to innovation. His patent and collaborative efforts highlight the importance of teamwork in advancing technological solutions.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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