The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 14, 2024
Filed:
Sep. 04, 2019
Icare Finland Oy, Vantaa, FI;
Mika Salkola, Espoo, FI;
Antti Jaatinen, Leppävirta, FI;
Kati Stranius, Kuopio, FI;
Mertsi Haapalainen, Kuopio, FI;
ICARE FINLAND OY, Vantaa, FI;
Abstract
An alignment means of a measurement instrument includes a housing an optical component having a principal axis in a direction parallel to a desired alignment; a first light source positioned at a first distance Sfrom the optical component and at a first height hfrom the principle axis; a second light source positioned at a second distance Sfrom the optical component and at a second height hfrom the principle axis; and an angle barrier means arranged between the optical component, and the first and second light sources. The housing, the optical component, and the angle barrier means are arranged to block visibility of the first light source along the principal axis at a distance superior to d′; and block visibility of the second light source along the principal axis at a distance smaller than d, wherein dis smaller than d