Mengjiao Zhang

Title: Mengjiao Zhang: Innovator in Semiconductor Testing

Introduction

Mengjiao Zhang is a prominent inventor based in Shanghai, China. He has made significant contributions to the field of semiconductor technology. His innovative approach has led to the development of a unique method for testing the lifetime of surface state carriers in semiconductors.

Latest Patents

Mengjiao Zhang holds a patent titled "Method for testing lifetime of surface state carrier of semiconductor." This patent describes a method that involves several steps. First, a narrow pulse light source emits a light pulse, which is coupled to a near-field optical probe. This probe generates photon-generated carriers on the surface of the semiconductor material under test through excitation. Next, the excited carriers are concentrated on the surface, where they recombine continuously with surface states acting as recombination centers. The process produces a change in the lattice constant due to an electronic volume effect, generating a stress wave that is detected using high-frequency broadband ultrasonic testing. Finally, fitting calculations on the stress wave signal yield the lifetime of the surface state carrier, denoted as τ.

Career Highlights

Mengjiao Zhang is affiliated with Tongji University, where he continues to advance research in semiconductor technologies. His work has garnered attention for its innovative methodologies and practical applications in the field.

Collaborations

Mengjiao Zhang collaborates with notable colleagues, including Qian Cheng and Weiya Xie. Their combined expertise contributes to the advancement of semiconductor research and development.

Conclusion

Mengjiao Zhang's contributions to semiconductor testing exemplify the importance of innovation in technology. His patented method enhances the understanding of surface state carriers, paving the way for future advancements in the field.