Mississauga, Canada

Mena Guirguis

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Ncr Atleos Corporation. Active years: 2026.

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Mena Guirguis: Innovator in Power Supply Detection Technology

Introduction

Mena Guirguis is a notable inventor based in Mississauga, Canada. He has made significant contributions to the field of power supply detection technology. His innovative approach focuses on enhancing the reliability of terminal power supply units.

Latest Patents

Mena Guirguis holds a patent for a groundbreaking invention titled "Terminal power supply degradation detection." This patent involves preprocessing event streams of terminals over a specified time interval to label event types and identify predefined patterns associated with power supply unit (PSU) failures. The labeled event streams are then input into a trained machine-learning model, which assesses the likelihood of each terminal experiencing a PSU failure. The model classifies terminals into risk categories, such as low, medium, or high risk, based on the scores generated. Additionally, the results are reported to the associated enterprise at predefined intervals.

Career Highlights

Mena Guirguis is currently employed at Ncr Atleos Corporation, where he continues to develop innovative solutions in the field of power supply technology. His work has garnered attention for its potential to improve the reliability of terminal operations.

Collaborations

Mena collaborates with talented colleagues, including Kun Zhu and Yingying Cai, who contribute to the advancement of their projects.

Conclusion

Mena Guirguis is a pioneering inventor whose work in power supply degradation detection showcases the intersection of technology and machine learning. His contributions are poised to make a significant impact in the industry.

Profile summary based on public USPTO records.
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