The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 17, 2026

Filed:

Aug. 30, 2022
Applicant:

Ncr Atleos Corporation, Atlanta, GA (US);

Inventors:

Yingying Cai, Atlanta, GA (US);

Ryan Albert Breeze, Guelph, CA;

Kun Zhu, Smyrna, GA (US);

Mena Guirguis, Mississauga, CA;

Virginia-May Risebrough Barnes, Seagrave, CA;

Assignee:

NCR Atleos Corporation, Atlanta, GA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 20/00 (2019.01); G06N 5/00 (2023.01); G06N 5/022 (2023.01); G06N 5/04 (2023.01); G06N 20/10 (2019.01); G06Q 20/10 (2012.01); G07F 9/00 (2006.01); G07F 19/00 (2006.01); G06Q 20/18 (2012.01); G06Q 20/20 (2012.01);
U.S. Cl.
CPC ...
G06N 5/022 (2013.01); G06N 5/04 (2013.01); G06N 20/00 (2019.01); G06N 20/10 (2019.01); G06Q 20/1085 (2013.01); G07F 9/001 (2020.05); G07F 9/002 (2020.05); G07F 19/20 (2013.01); G07F 19/209 (2013.01); G06Q 20/18 (2013.01); G06Q 20/20 (2013.01);
Abstract

Event streams of terminals for a given interval of time are preprocessed to label event types and label predefined time-based or sequence-based patterns associated with terminal power supply unit (PSU) failures. The labeled event streams are provided as input to a trained machine-learning model (MLM), which outputs a score for each terminal representing a likelihood that the corresponding terminal is or is not going to experience a PSU failure. In an embodiment, each score is compared against one or more threshold values and each terminal is classified as low risk, medium risk, or high risk of a PSU failure. In an embodiment, the scores and/or the classifications for the terminals are reported to an enterprise associated with the terminals at predefined intervals of time.


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