Zichron-Yaakov, Israel

Meir Bar Tal

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Elbit Systems Ltd.. Active years: 2007.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Meir Bar Tal. Retrieved from https://idiyas.com/inventor/meir-bar-tal-62sd0bf2

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0


Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 6(Granted Patents)


Company Filing History:


Years Active: 2007

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1 patent (USPTO):Explore Patents

Title: Meir Bar Tal: Innovator in Electromagnetic Systems

Introduction

Meir Bar Tal is a notable inventor based in Zichron Yakov, Israel. He has made significant contributions to the field of electromagnetic systems, particularly in the area of position and orientation estimation.

Latest Patents

Meir Bar Tal holds a patent for a method titled "Estimating position and orientation in electromagnetic systems." This innovative approach involves adapting electromagnetic (EM) field model parameters by minimizing the difference between a model for the measurements and actual measurements. The process includes estimating model parameters, as well as position and/or orientation. The model may also encompass system model parameters, which can involve one or more sensors and radiators. He has 1 patent to his name.

Career Highlights

Meir Bar Tal is associated with Elbit Systems Ltd., a prominent company in the defense and high-tech sectors. His work at Elbit Systems has allowed him to apply his expertise in developing advanced technologies.

Collaborations

Throughout his career, Meir has collaborated with talented individuals such as Eytan Paldi and Mark Gandelsman. These partnerships have contributed to the advancement of innovative solutions in their field.

Conclusion

Meir Bar Tal's work in electromagnetic systems showcases his innovative spirit and dedication to advancing technology. His contributions are valuable to the industry and highlight the importance of collaboration in achieving groundbreaking results.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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