The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 02, 2007
Filed:
Jan. 24, 2003
Applicants:
Meir Bar Tal, Zichron Yakov, IL;
Eytan Paldi, Haifa, IL;
Mark Gandelsman, Haifa, IL;
Eugene Gurovich, Yoknean, IL;
Inventors:
Meir Bar Tal, Zichron Yakov, IL;
Eytan Paldi, Haifa, IL;
Mark Gandelsman, Haifa, IL;
Eugene Gurovich, Yoknean, IL;
Assignee:
Elbit Systems Ltd., Haifa, IL;
Primary Examiner:
Int. Cl.
CPC ...
G06F 7/60 (2006.01); G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method for adapting electromagnetic (EM) field model parameters including the steps of minimizing the difference between a model for the measurements and one or more measurements. The minimizing may be done by estimating model parameters, and at least position and/or orientation. The model may further include system model parameters, wherein the system may include one or more sensors and one or more radiators.