This inventor holds 1 USPTO granted patent. Top assignee: Advanced Micro Devices Corporation. Active years: 2000.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2000
Title: Mehdad Mahanpour: Semiconductor Test-Innovation Inventor.
Introduction
Mehdad Mahanpour is an inventor associated with Union City, California, and Advanced Micro Devices Corporation. His patent work addresses fault detection in flip-chip semiconductor packages.
Latest Patents
Mahanpour is credited with 1 patent: “Method and System for Detecting Faults in a Flip-Chip Package.” The invention describes thinning a semiconductor die without damaging its circuit, applying a fast-evaporating liquid to the exposed surface, and powering the circuit. By identifying where the liquid evaporates, the method can help locate a fault in the circuit.
Career Highlights
Mahanpour’s listed invention focuses on semiconductor testing and fault diagnosis. The approach uses liquid evaporation as an indicator to help detect faults in circuits within flip-chip packages.
Collaborations
His listed coworkers include Ahmad Ghaemmaghami and Fred Khosropour. The patent information connects Mahanpour’s work with Advanced Micro Devices Corporation.
Conclusion
Mehdad Mahanpour’s patent describes a practical approach to detecting circuit faults in flip-chip packages, contributing to semiconductor testing innovation.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile