Company Filing History:
9 out of 21,351 
1 out of 5 
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Years Active: 1999-2010
Title: Megumi Takemoto: Innovator in Semiconductor Testing Technology
Introduction
Megumi Takemoto is a prominent inventor based in Tokyo, Japan. She has made significant contributions to the field of semiconductor testing technology. With a total of 11 patents to her name, her work has advanced the capabilities of testing high-frequency semiconductor devices.
Latest Patents
One of her latest patents is a test jig designed for testing the electrical characteristics of packaged high-frequency semiconductor devices. This innovative test jig includes a test circuit substrate with a microstrip line structure, a grounding block, and a high-frequency signal contact pin. The design allows for efficient testing by ensuring proper electrical connections between the semiconductor device and the testing equipment. Another notable patent is a semiconductor device test probe, which features a spherical tip portion that establishes electrical contact with the electrode pad of an integrated semiconductor device. This probe is engineered to optimize testing functions, ensuring accuracy and reliability in semiconductor evaluations.
Career Highlights
Throughout her career, Megumi has worked with notable companies, including Mitsubishi Electric Corporation. Her experience in these organizations has allowed her to refine her skills and contribute to groundbreaking technologies in the semiconductor industry.
Collaborations
Megumi has collaborated with esteemed colleagues such as Shigeki Maekawa and Yoshihiro Kashiba. These partnerships have fostered innovation and have been instrumental in the development of her patented technologies.
Conclusion
Megumi Takemoto's contributions to semiconductor testing technology exemplify her dedication to innovation. Her patents reflect her expertise and commitment to advancing the field, making her a significant figure in the industry.