This inventor holds 4 USPTO granted patents and 1 published patent application. Top assignee: Sharp Kabushiki Kaisha Corporation. Active years: 2015-2016.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2015-2016
Title: Megumi Hijikuro: Innovator in Measurement Technology
Introduction
Megumi Hijikuro is a prominent inventor based in Osaka, Japan. She has made significant contributions to the field of measurement technology, holding a total of 4 patents. Her work focuses on developing advanced devices and systems that enhance measurement accuracy and efficiency.
Latest Patents
Among her latest patents, Megumi has developed a measuring device that includes a detector control module for obtaining measurement data of fluorescence. This device utilizes a scanning mechanism with an excitation light source and a detector to receive fluorescence generated from the measurement target. Additionally, she has created a detection device that features a light receiving unit, which calculates the light receiving intensity of fluorescence while adjusting the relative position between the light receiving unit and the test subject. These innovations demonstrate her commitment to advancing measurement technologies.
Career Highlights
Megumi Hijikuro is associated with Sharp Kabushiki Kaisha Corporation, where she continues to push the boundaries of measurement technology. Her work has garnered attention for its practical applications in various industries, showcasing her expertise and innovative spirit.
Collaborations
Some of her notable coworkers include Mikihiro Yamanaka and Keita Hara, who contribute to her projects and research endeavors. Their collaboration enhances the development of cutting-edge technologies in the field.
Conclusion
Megumi Hijikuro's contributions to measurement technology exemplify her role as a leading inventor. Her innovative patents and collaborations reflect her dedication to advancing the field and improving measurement systems.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
