The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 03, 2015
Filed:
Nov. 17, 2010
Applicants:
Mikihiro Yamanaka, Osaka, JP;
Megumi Hijikuro, Osaka, JP;
Keita Hara, Osaka, JP;
Inventors:
Assignee:
SHARP KABUSHIKI KAISHA, Osaka, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01); A61B 5/1455 (2006.01); A61B 5/145 (2006.01); A61B 5/00 (2006.01);
U.S. Cl.
CPC ...
A61B 5/1455 (2013.01); A61B 5/0071 (2013.01); A61B 5/14546 (2013.01); A61B 5/743 (2013.01); A61B 5/489 (2013.01); A61B 5/6824 (2013.01); A61B 5/6835 (2013.01); A61B 2562/185 (2013.01);
Abstract
A measurement device () includes a probe () which irradiates a specific part or a specific location of a living body with excitation light and which receives fluorescence generated by irradiating the specific part or the specific location with excitation light.
Yamanaka, Mikihiro. (2015). Measurement device, measurement method, measurement result processing device, measurement system, measurement result processing method, control program, and recording medium (U.S. Patent No. 9173604). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9173604
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