Elgin, IL, United States of America

Meghan Elizabeth Charochak

This inventor holds 1 USPTO granted patent. Top assignee: Honeywell International Inc.. Active years: 2021.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Meghan Elizabeth Charochak. Retrieved from https://idiyas.com/inventor/meghan-elizabeth-charochak

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2021

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1 patent (USPTO):Explore Patents

Title: Meghan Elizabeth Charochak: Inventor in Optical Particle Sensing

Introduction

Meghan Elizabeth Charochak is an inventor associated with Elgin, Illinois, and Honeywell International Inc. Her work includes an invention for monitoring particles in process fluids using optical sensing. She is credited with 1 patent.

Latest Patents

Charochak’s patent, “Foul-Resistant Coating of Windows for Optical Particle Sensing,” describes a system for in-situ monitoring of particles in a process fluid. The system uses a flow channel with a window whose coated inner surface reduces the rate at which particles build up.

A light source directs polarized light through the window and into the fluid. A polarizing filter and photodetector capture the resulting light and generate signals representing images of particles. A controller analyzes those signals to determine at least one parameter related to the particles.

Career Highlights

Charochak’s listed patent connects her work with optical sensing and process-fluid monitoring. The invention addresses particle buildup on sensing windows, which can affect the collection of optical measurements.

Collaborations

Charochak is associated with Honeywell International Inc. Her listed coworkers include Markku Kellomaki and Brendon Lyons.

Conclusion

Meghan Elizabeth Charochak’s patent describes a foul-resistant optical sensing system designed to support particle monitoring in process fluids.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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