The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 16, 2021
Filed:
Aug. 21, 2019
Honeywell International Inc., Morris Plains, NJ (US);
Tobias Nebel, North Vancouver, CA;
Markku Kellomaki, Pohjois-Savo, FI;
Brendon Lyons, Monroe Township, NJ (US);
Meghan Elizabeth Charochak, Elgin, IL (US);
Honeywell International Inc., Morris Plains, NJ (US);
Abstract
A system for in-situ monitoring of particles in a process fluid includes a flow channel having a window for flowing the process fluid therethrough. The window includes an inner surface having a coating thereon that reduces a buildup rate of the particles on the inner surface. A light source is for directing a polarized beam along a first beam path through the window into the process fluid such that an output beam emerges from the process fluid along a second beam path. A polarizing filter positioned in the second beam path is for filtering the output beam. A photodetector is for detecting the output beam after passing the polarizing filter that generates signals that represent images of the particles in the process fluid. A controller coupled to the photodetector is for analyzing the signals to determine at least one parameter related to the particles in the process fluid.