Kanagawa, Japan

Megamu Shio

This inventor holds 1 USPTO granted patent. Top assignee: Japan Science and Technology Corporation. Active years: 2005.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Megamu Shio. Retrieved from https://idiyas.com/inventor/megamu-shio

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2005

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1 patent (USPTO):Explore Patents

Title: Megamu Shio: Innovator in Optical Microscopy

Introduction

Megamu Shio is a notable inventor based in Kanagawa, Japan. He has made significant contributions to the field of optical microscopy, particularly with his innovative designs that enhance the stability and clarity of microscope observations.

Latest Patents

Shio holds a patent for a "Vertical fine movement mechanism of microscope." This invention is designed to provide an optical microscope with high stability, ensuring that the image of a sample remains clear during observation. The mechanism prevents any movement or drift of the object point, which is crucial for accurate imaging. The optical microscope features vertical straight movement guide mechanisms that are symmetrical to the optical axis, along with fine adjustment units for the objective lens.

Career Highlights

Megamu Shio is affiliated with the Japan Science and Technology Corporation, where he continues to work on advancing optical technologies. His dedication to innovation in microscopy has positioned him as a key figure in this specialized field.

Collaborations

Shio collaborates with Kazuhiko Kinoshita, contributing to the development of advanced optical systems and enhancing the capabilities of microscopy.

Conclusion

Megamu Shio's work in optical microscopy exemplifies the importance of innovation in scientific research. His patented mechanisms significantly improve the functionality of microscopes, paving the way for more precise observations in various scientific fields.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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