The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 01, 2005
Filed:
Jun. 13, 2002
Applicants:
Kazuhiko Kinoshita, Aichi, JP;
Megamu Shio, Kanagawa, JP;
Inventors:
Kazuhiko Kinoshita, Aichi, JP;
Megamu Shio, Kanagawa, JP;
Assignee:
Japan Science and Technology Corporation, Saitama, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B021/00 ; G02B021/26 ;
U.S. Cl.
CPC ...
Abstract
An optical microscope of high stability such that the image of a sample does not become obscure during observation, and no movement (drift) of an object point (object) occurs. The optical microscope is characterized by comprising vertical straight movement guide mechanisms (and) for an objective lens () of the microscope symmetrical to the optical axis, and fine adjustment units (and) for the objective lens.
Quick Actions:
Kinoshita, Kazuhiko. (2005). Vertical fine movement mechanism of microscope (U.S. Patent No. 6961173). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6961173
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